Apparatus for automatically measuring particulate emissions...

Details Apparatus for automatically measuring particulate emissions... Apparatus for automatically measuring particulate emissions...

G - Physics

01

N

73/104, 73/97

G01N 1/24 (2006.01) G01N 1/22 (2006.01)

Patent

CA 1047275

APPARATUS FOR AUTOMATICALLY MEASURING PARTICULATE EMISSIONS IN GAS FLOW Abstract of the Disclosure A stack sampler for collecting particulate samplings in gaseous emissions includes means for automatically matching the volume rate of flow through the sampler to the flow in the stack. Pressure drops and temperatures in the stack and in the sampler are continuously detected and applied to calculating circuitry which control a valve in the sampler for maintaining isokinetic flow conditions. Filter means removably disposed in the sampler collects particulate material from the gaseous emission during the isokinetic flow which is obtained. Also, flow and flow rate are detected and displayed.

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