Apparatus for characterizing high temperature...

Details Apparatus for characterizing high temperature... Apparatus for characterizing high temperature...

G - Physics

01

R

G01R 27/02 (2006.01) G01R 27/14 (2006.01) G01R 27/16 (2006.01) G01R 27/26 (2006.01)

Patent

CA 2142827

A dielectric resonator apparatus for measuring the parameters of high temperature superconducting thin film is disclosed having improved means for positioning the dielectric and substrates, holding the resonator components in place during use, sup- pressing undesirable modes, adjusting the magnetic dipole coupling, and coupling to an electrical circuit.

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