Apparatus for gauging the texture of a conducting surface

Details Apparatus for gauging the texture of a conducting surface Apparatus for gauging the texture of a conducting surface

G - Physics

01

R

340/135.2

G01R 27/26 (2006.01) G01B 7/34 (2006.01)

Patent

CA 1091781

APPARATUS FOR GAUGING THE TEXTURE OF A CONDUCTING SURFACE ABSTRACT OF THE DISCLOSURE A capacitance gauging apparatus is described for monitoring the texture or flatness of a conductive surface. Conductive plate members, resiliently supported on a flexible substrate, provide a probe to measure the texture of a surface to be monitored, the surface itself forming the other plate of a capacitor. The capacitance probe is electrically energized and connected to a monitoring circuit. As the insulated probe rests on the conducting surface, the resulting capacitance changes the frequency of the monitoring circuit. The monitoring circuitry counts the pulses within a period, the number of pulses being proportional to the surface texture, i.e., the higher the number, the coarser the surface texture, and conversely. The period of counting is set such that the surface texture may be displayed directly in microinches or micrometers.

285415

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