Apparatus for measuring characteristics of electronic devices

Details Apparatus for measuring characteristics of electronic devices Apparatus for measuring characteristics of electronic devices

G - Physics

01

R

356/117

G01R 31/26 (2006.01)

Patent

CA 1242813

-32- ABSTRACT An electronic device measurement apparatus measures a characteristic of an electronic device under test(DUT) by applying a sine-wave voltage to the DUT,detecting a voltage across the DUT and a current flowing through the DUT and displaying a characteristic curve in accordance with the detected voltage and current. Since the sine-wave voltage is generated in phase with an AC line voltage and an amplitude thereof is independent of the line voltage, each of circuits in the measurement apparatus is not affected by variation of the phase and amplitude of the line voltage. Moreover, the sine-wave voltage is symmetrical, so that a display distortion can be eliminated.

491897

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