G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 15/00 (2006.01) G01N 15/02 (2006.01) G01N 21/47 (2006.01)
Patent
CA 2310625
An apparatus for measuring the intensity of scattered light from a sample in terms of a function of a scattering angle, comprising an ellipsoidal mirror (24) for reflecting scattered light from a sample (23) and concentrating the same, an imaging lens (25) disposed at a concentration point of the reflected light from the ellipsoidal mirror (24) and forming an image of the image formed on the surface of the ellipsoidal mirror (24), and a camera (26) for recording the image formed by the imaging lens (25), whereby the detection of scattered light in a range of a wide angle in a very short period of time.
L'invention concerne un appareil permettant de mesurer, pour un angle de diffusion, l'intensité d'une lumière diffusée provenant d'un échantillon. Cet appareil comporte un miroir ellipsoïdal (24), une lentille de formation d'image (25), et une caméra (26). Le miroir ellipsoïdal (24) permet de réfléchir de la lumière diffusée provenant d'un échantillon (23) et de la concentrer. Le lentille (25) de formation d'image est placée en un foyer de concentration de la lumière réfléchie par le miroir ellipsoïdal (24). Cette lentille assure la formation d'une image de l'image formée à la surface du miroir ellipsoïdal. La caméra (26) est destinée à enregistrer l'image formée par la lentille (25) de formation d'image. Cet appareil permet de détecter une lumière diffusée sous un grand angle en un laps de temps très court.
Funato Masayoshi
Hamada Tetsuo
Kawaguchi Akira
Oka Koichi
Tsujio Michio
Otsuka Electronics Co. Ltd.
Riches Mckenzie & Herbert Llp
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