Apparatus for measuring surface reflectance characteristics

Details Apparatus for measuring surface reflectance characteristics Apparatus for measuring surface reflectance characteristics

G - Physics

01

N

73/58

G01N 21/01 (2006.01) G01N 21/55 (2006.01)

Patent

CA 1141986

ABSTRACT An instrument for measuring surface characteristics based on the opacity of a material has an optical projection system for illuminating a sample and photocell arrangement for measuring light reflected from the sample. The instrument contains standard black and white surfaces with reference to which the sample opacity is measured. The photocell signal is digitised and the results processed and calculations made by a microprocessor system enabling sets of results to be stored and mean and standard deviations calculated. The instrument is particularly intended for testing paper and in connection with carbonless copy paper enables a measure to be made of the density of an imprint relative to the background that is called calender intensity.

356987

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