Apparatus for measuring the accuracy of parallel platen tie...

G - Physics – 01 – M

Patent

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Details

G01M 13/00 (2006.01) B29C 45/80 (2006.01) G01B 11/26 (2006.01) G01B 11/27 (2006.01) G01B 11/30 (2006.01)

Patent

CA 2168528

A laser apparatus for inspecting machine tie bars. The apparatus broadly comprises a laser emitter, a photocell target, a control unit, a computer, a display unit and precision adapters for mounting the emitter and target. The laser emitter is mounted on a fixed platen and oriented substantially square to a surface of the fixed platen. The target is mounted on the tie bar and intercepts a laser beam from the emitter to generate voltages which are processed in the control unit and computer. Angular and lateral deviations of the laser beam from a rotational axis of the target, which are indicative of tie bar straightness and squareness, are displayed on the display unit.

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