Apparatus for measuring the thickness profile of rolled strips

Details Apparatus for measuring the thickness profile of rolled strips Apparatus for measuring the thickness profile of rolled strips

G - Physics

01

B

358/6

G01B 15/00 (2006.01) G01B 15/02 (2006.01)

Patent

CA 1255398

Abstract To determine the thickness profile of rolled metal sheets by measuring the absorption of X-rays a slit diaphragm is used which is rotatable about the imaginary centre axis of the X-ray tube, the rotation consisting of a reciprocating movement lying in a range of less than 36°. Between the reversal points of the rotation the rotational movement takes place in steps with rest intervals lying therebetween. (Fig. 1)

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