Apparatus for physical properties measurements at high...

Details Apparatus for physical properties measurements at high... Apparatus for physical properties measurements at high...

G - Physics

01

N

73/59, 358/7

G01N 23/00 (2006.01) G01N 1/28 (2006.01) G01N 21/03 (2006.01) G01N 23/06 (2006.01) G01N 30/30 (2006.01) G01N 30/36 (2006.01) G01N 30/74 (2006.01)

Patent

CA 1189202

ABSTRACT OF THE DISCLOSURE "APPARATUS FOR PHYSICAL PROPERTIES MEASUREMENTS AT HIGH TEMPERATURES AND PRESSURES" An apparatus is disclosed for measuring physical properties of a sample material at controllable temperatures and pressures. The apparatus includes a sample cell for hold- ing fluid and/or solid samples. The cell includes at least one optically transparent window permitting visual and electro- magnetic energy observations of the sample. A probe functions within the cell to collect a subsample for movement to appa- ratus for measuring properties and for returning the subsample to the cell. One form of optically transparent window is a sapphire. The cell is intended for measurements of physical properties at temperatures from about -40°F to about +400°F and at pressures from vacuum to at least 20,000 pounds per square inch.

414948

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