Apparatus for testing input pin leakage current of a device...

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G01R 31/28 (2006.01) G01R 31/04 (2006.01) G01R 31/30 (2006.01) G01R 31/319 (2006.01) G01R 31/3193 (2006.01)

Patent

CA 1300228

Abstract of the Disclosure Apparatus for testing leakage currents of input pins of an electronic device under test including a connector having a plurality of contacts for making electrical contact to respective input pins, a plurality of current measuring circuits connected to respective contacts of the connector for sensing leakage currents and providing analog outputs indicating current, a multiplexer connected to receive the analog outputs and selectively provide one analog output as a multiplexer output, and an analog-to-digital converter connected to receive the multiplexer output and provide a digital output indicating leakage current. Also disclosed are storing a limit value for each pin in a limit memory and comparing the limit values with the multiplexer outputs; using a plurality of digital-to-analog converters to selectively provide desired inputs to the input pins; and using a correction memory storing a correction value for each pin to correct the multiplexer output.

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