G - Physics – 01 – R
Patent
G - Physics
01
R
324/37
G01R 23/00 (2006.01) G01R 23/15 (2006.01) G01R 31/28 (2006.01)
Patent
CA 1181811
APPARATUS FOR TESTING THE LINEARITY OF A FREQUENCY MODULATED OSCILLATOR by Abram Froese and Josef L. Fikart Abstract of Disclosure An APC (automatic phase control) circuit is utilized to measure the linearity of an FMO (frequency modulated oscillator). In accordance with a common APC concept a programmable divider is connected to an output of said frequency modulatable oscillator to produce a binary output signal having a predetermined pulse repetition rate. This signal is compared with a reference signal in a phase control comparator producing a DC control signal which is applied to the control input of said frequency modulated oscillator to maintain the average oscillator frequency constant. This DC control voltage gives an indication of average free running frequency of the oscillator. To measure linearity, the said binary signal at the programmable divider output is also further divided and processed to produce a low frequency square waveform which is applied via a manual ON/OFF switch and a modulation amplifier to the modulation input of the said FMO. The change in the average free running frequency of the FMO, and the corresponding change in the DC control voltage resulting from alternatively switching the low frequency waveform ON and OFF, is a measure of the FMO's linearity. This change is amplified and a zero center meter is employed to indicate the magnitude and sign of the error, and to permit adjustment to obtain a minimum error indication.
394961
Fikart Josef L.
Froese Abram
Ael Microtel Ltd.
Wray Robert William
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