Apparatus for the classification of a pattern for example on...

G - Physics – 07 – D

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G07D 7/00 (2006.01) G06K 9/52 (2006.01) G06K 9/68 (2006.01) G07D 7/20 (2006.01)

Patent

CA 2088349

ABSTRACT An apparatus for the classification of a pattern, in particular on a banknote or a coin, has a receiving system for detecting by a measurement procedure vectors of a test item, a pre-processing system for transformation of the measured vectors into local feature vectors ALCi(1) and a learning classification system (8) for carrying out a plurality of testing operations. A first activity (14) compares in a first testing operation each of the local feature vectors ALCi(1) to a vectorial reference value. It is only if the first testing operation takes place successfully that the first activity, by means of first estimates which are stored in a data base, links the local feature vectors ALC(1) to provide global line feature vectors AGIi. In a second testing operation a third activity (18) compares the global line feature vectors AGIi to corresponding reference values and, if the second testing operation is successful, computes a single global surface vector AGF of which a fourth activity (21), in a third testing operation, compares its distance in accordance with Mahalanobis relative to an estimated surface vector to a reference value. The test item is reliably classified if all three testing operations take place successfully.

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