Arrangement for exchanging measuring and/or sampling probes

Details Arrangement for exchanging measuring and/or sampling probes Arrangement for exchanging measuring and/or sampling probes

G - Physics

01

N

73/102

G01N 1/00 (2006.01) C21C 5/46 (2006.01) G01N 1/12 (2006.01)

Patent

CA 1203093

ABSTRACT OF THE DISCLOSURE: There is disclosed an arrangement for exchanging measuring and/or sampling probes capable of being slipped on to a holding means arranged on the lower end of a vertically movable lance with friction-tight contact. It includes a grab clamping the probe and being movable from an operation position below the lance into a position laterally therebeside. In order to be able to slip on a probe to a holding means assuming a position that deviates from the ideal position, without damage to the holding means and the probes, the grab is cardanically mounted on the arrangement.

442228

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