Array logic systems for use in pattern recognition...

Details Array logic systems for use in pattern recognition... Array logic systems for use in pattern recognition...

H - Electricity

03

K

354/59

H03K 19/08 (2006.01) G06K 9/46 (2006.01) H03K 19/177 (2006.01)

Patent

CA 1053803

ABSTRACT Improved features for a fabrication arrangement that reduces the number of LSI chips required in a bit stream measurement system comprised of a plurality of measurement elements, each element including a large programmable array. The improvements relate the chip and measurement element fabrication to the detection significance of parts of the bit stream by substituting delay shift registers for array portions to handle the less significant parts of the bit stream in some measurement elements. The detection operations can then be concentrated on the more significant parts of a bit stream, such as the part representing the top, bottom, left or right portion of an optical character recognition machines bit stream represented character frame. The resulting modifications in chip and element fabrication result in a further reduction in the average number of chips required in the measurement system. The LSI array chips can be identically made.

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