G - Physics – 01 – N
Patent
G - Physics
01
N
358/11.1
G01N 23/02 (2006.01) G01N 23/04 (2006.01) G01R 31/302 (2006.01) G01R 31/304 (2006.01)
Patent
CA 1323453
Abstract A tomographic inspection system wherein the electron beam of a microfocus X-ray tube is deflected in a circular scan pattern onto the tube anode in synchronization with a rotating detector that converts the X-ray shadowgraph into an optical image and derotates the image so as to be viewed and integrated in a stationary video camera. A computer system controls an automated positioning system that supports the item under inspection and moves successive areas of interest into view. In order to maintain high image quality, a computer system also controls the synchronization of the electron beam deflection and rotating optical system, making adjustments for inaccuracies of the mechanics of the system. The computer system can also operate under program control to automatically analyze data, measure characteristics of the item under inspection and make decisions regarding the acceptability of the item's quality. The invention produces high resolution images in rapid succession so as to be suitable for use in conjunction with manufacturing production lines and capable of inspecting electronic devices, solder connections, printed wiring boards and other assemblies. DHE-2012:de21 103087
579869
Adams John A.
Baker Bruce D.
Corey Robert L.
Ross Edward W.
Agilent Technologies
Gowling Lafleur Henderson Llp
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