Automated position control of a surface array relative to a...

Details Automated position control of a surface array relative to a... Automated position control of a surface array relative to a...

H - Electricity

01

J

H01J 49/04 (2006.01)

Patent

CA 2610450

A system (20) and method utilizes an image analysis approach for controlling the probe-to-surface distance of a liquid junction-based surface sampling system for use with mass spectrometric detection. Such an approach enables a hands-free formation of the liquid micro junction used to sample solution composition from the surface and for re-optimization, as necessary, of the micro junction thickness during a surface scan to achieve a fully automated surface sampling system.

L'invention concerne un système (20) et un procédé mettant en oeuvre une méthode d'analyse d'image pour réguler la distance sonde-surface d'un système d'échantillonnage de surface basé sur une jonction liquide, destiné à être utilisé dans la détection spectrométrique de masse. Cette méthode permet une formation mains libres de la microjonction liquide utilisée pour échantillonner une composition de solution à partir de la surface et une ré-optimisation, si nécessaire, de l'épaisseur de la microjonction pendant un balayage de surface, de sorte à obtenir un système d'échantillonnage de surface entièrement automatisé.

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