Automatic circuit tester control system

Details Automatic circuit tester control system Automatic circuit tester control system

G - Physics

01

R

324/58.2

G01R 31/319 (2006.01)

Patent

CA 1288817

Abstract of the Disclosure Apparatus for providing high speed control of digital test patterns in automatic test equipment, the apparatus including a data random access memory (RAM) storing data of nonsequential vectors, a sequential data memory storing blocks of data of sequential vectors, the sequential data memory having higher capacity than the data RAM, a formatter for receiving data from the data RAM or the sequential data memory and using it to provide inputs to a circuit under test, and a sequence controller controlling selective routing of data from the data RAM or the sequential data memory to the formatter.

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