Automatic defect detection process for mechanical parts with...

G - Physics – 01 – N

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G01N 23/04 (2006.01) G01M 13/00 (2006.01)

Patent

CA 2207833

The automatic defect detection process on a fluoroscope image of a complex part consists in segmenting the fluoroscope image into two classes of area so as to obtain a binary image, called a mask, in which the zones that can be assessed and those that cannot are given the values 1 and 0, respectively, then applying to the fluoroscope image conditional morphological transformations developed from a conditional structuring element. The conditional structuring element is obtained by intersection between a traditional structuring element and the mask. Application in particular to the assessment of cast vanes by fluoroscopy.

Le procédé de détection automatique de défauts sur une radioscopie de pièce complexe consiste à segmenter l'image radioscopique en deux classes de zones de manière à obtenir une image binaire, appelée masque, dans laquelle les zones expertisables et les zones non expertisables prennent respectivement les valeurs 1 et 0 puis à appliquer à l'image radioscopique des transformations morphologiques conditionnelles élaborées à partir d'un élément structurant conditionnel. L'élément structurant conditionnel est obtenu par intersection entre un élément structurant classique et le masque. Application notamment à l'expertise des aubes de fonderie contrôlées par radioscopie.

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