Automatic hi-pot, megohmeter and continuity, circuit tester

Details Automatic hi-pot, megohmeter and continuity, circuit tester Automatic hi-pot, megohmeter and continuity, circuit tester

G - Physics

01

R

G01R 31/02 (2006.01) G01R 31/14 (2006.01) G01R 31/00 (2006.01) G01R 31/12 (2006.01)

Patent

CA 2456283

Provided is an apparatus and method used to perform automatic high potential (hi-pot), megohmeter and continuity, circuit test which includes a power source connected to a central processing unit (cpu) having a floppy drive, a hard drive, an analog to digital (A/D) printed circuit board (pcb), and a predetermined number of digital I/O pcb's, a hi-pot device, and a power supply. A data entry device is connected to the cpu for providing input thereto. A display device is provided for displaying data. A hi-pot device is connected to the A/D pcb and to a digital I/O pcb for providing an input voltage of a predetermined magnitude. A multiplexes is connected to the power supply and to a digital I/O pcb and the hi-pot device for communicating the input voltage to a predetermined number of external circuits to provide testing of the external circuits.

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