Automatic measurement of impedance

Details Automatic measurement of impedance Automatic measurement of impedance

G - Physics

01

R

324/43

G01R 27/14 (2006.01) G01R 27/02 (2006.01)

Patent

CA 1085460

METHOD OF AND APPARATUS FOR AUTOMATIC MEASUREMENT OF IMPEDANCE OR OTHER PARAMETERS WITH MICROPROCESSOR CALCULATION TECHNIQUES Abstract of Disclosure This disclosure is concerned with a new technique for automatically measuring impedance (though the process is also applicable to other parameters and characteristics as well) wherein a series of voltages are sequentially presented to a common detector and analog-to-digital con verter, the numerical values of which voltages are of themselves meaningless, but from which, with the aid of microprocessor calculating equipment, ratios may be cal- culated that indicate impedance (or other parameters).

273041

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