Automatic optical inspection system

Details Automatic optical inspection system Automatic optical inspection system

G - Physics

01

N

350/32, 354/57,

G01N 21/88 (2006.01)

Patent

CA 1229898

AUTOMATIC OPTICAL INSPECTION SYSTEM Abstract of the Disclosure An automatic optical inspection system, for inspecting printed circuit boards and the like, employs so-called dimensional verification and pattern recognition techniques simultaneously. The printed circuit board is scanned by means of a CCD camera to produce a binarized image of the board. The image is stored and access provided to a set of picture elements arranged in a generally circular configuration and which are spaced apart by a dimension to be monitored by dimensional verification (DV) means. Access is also provided to a second set of picture elements arranged in a generally rectangular array of picture elements for the pattern recognition (PR) means, which uses template matching to determine their validity. The DV and PR outputs are weighted and clustered before a fault is signalled. - i -

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