G - Physics – 01 – K
Patent
G - Physics
01
K
341/32.1, 73/0.5
G01K 7/10 (2006.01) G01K 15/00 (2006.01) G01N 25/48 (2006.01) G05D 23/19 (2006.01)
Patent
CA 1127738
ABSTRACT A system for use in thermal analysis for correcting discrepancies between oven temperataure and desired sample temperature including means for automatically calibrating the system at several selected points in the analytical temperature scale wherein actual sample temperature is forced to agree exactly with desired sample temperature by appropriately changing oven temperature and wherein the calibrated sample temperature and the difference between oven temperature and sample temperature at the several points are used to correct for discrepancies throughout the intervening analytical temperature scale.
344516
Babil Simon
Muir Andrew R.
Osler Hoskin & Harcourt Llp
Perkin-Elmer Corporation The
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