Automatic test equipment for integrated circuits

Details Automatic test equipment for integrated circuits Automatic test equipment for integrated circuits

G - Physics

01

R

356/117

G01R 19/257 (2006.01)

Patent

CA 1284233

Abstract The apparatus (10) includes a semiconductor tester (12) which in operation produces an analog signature signal relative to a circuit node of an elec- tronic circuit, such as a pin connection of an inte- grated circuit. The analog signature signal is the result of horizontal and vertical signals which are also directed to an integrator/A-D converter (44) which produces therefrom a set of four digital signals representing said analog signature. These digital signals are then compared in a computer (50) against reference digital values for the same circuit node of the same electronic circuit which is known to be good. If the digital signals are not within a selected range relative to the reference digital values, the analog signature of the circuit node is displayed for inspec- tion and evaluation by an operator.

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