Automatic test system utilizing interchangeable test devices

Details Automatic test system utilizing interchangeable test devices Automatic test system utilizing interchangeable test devices

G - Physics

01

R

324/58.2

G01R 31/28 (2006.01) G01R 31/00 (2006.01) G01R 31/319 (2006.01)

Patent

CA 1174732

11 48,797 ABSTRACT OF THE DISCLOSURE An automatic test system controlled by a general purpose digital central processor is disclosed. The central processor accepts test programs in a high level compiler language such as Atlas. The Atlas program is compacted into a simplified language which is utilized to communicate with test devices via a standard IEEE 488 data bus. Each of the test devices includes a programmable interface digital processor which performs any translation that may be necessary in order to permit specific test instruments coupled to the central processor via the interface processor to perform the tests specified by the high level test programs. A switching matrix also commun- icates with the digital processor to connect the appro- priate test device to the unit under test.

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