Automation methodology for 3d image metrology systems

Details Automation methodology for 3d image metrology systems Automation methodology for 3d image metrology systems

G - Physics

06

T

G06T 17/00 (2006.01) G06F 19/00 (2006.01) G06T 7/00 (2006.01)

Patent

CA 2245175

Method of 3D image metrology using auto-identifiable targets, by determining the exterior orientation of images comprising targets and/or pattern or groups of targets.

On décrit un procédé de mesure d'images en trois dimensions à l'aide de cibles identifiables automatiquement, lequel consiste à déterminer l'orientation extérieure d'images comprenant des cibles et/ou un modèle ou des groupes de cibles.

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