Beam generating system for electron beam measuring instruments

Details Beam generating system for electron beam measuring instruments Beam generating system for electron beam measuring instruments

H - Electricity

01

J

358/26

H01J 37/07 (2006.01) H01J 1/18 (2006.01)

Patent

CA 1302592

ABSTRACT OF THE DISCLOSURE Beam generating system for electron beam measuring instruments. In prior art beam generators, the life expectancy of directly heated boride cathodes is limited by their thermally disadvantageous mount. The present invention provides a cathode not clamped at the lower end of the crystal shank as was previously standard, but clamped immediately below the cathode tip. The inventive mount of the boride cathode results in the crystal being only insignificantly hotter in the region of the clamping plane than at the electron-emitting tip.

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