G - Physics – 02 – F
Patent
G - Physics
02
F
345/56
G02F 1/00 (2006.01) G02F 1/295 (2006.01) H01S 5/062 (2006.01)
Patent
CA 1132695
BEAM SCANNING USING RADIATION PATTERN DISTORTION ABSTRACT OF THE INVENTION A laser beam scanner in which a single-lobe propogates radiation pattern through an electrically variable asymmetric electrical charge distribu- tion. Because the electrical charge distribution determines the real and imaginary parts of the refractive index of the material through which the radiation pattern propogates the radiation pattern may be deflected by changing the charge distribution profile.
328067
Burnham Robert D.
Scifres Donald R.
Streifer William
Sim & Mcburney
Xerox Corporation
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