G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 21/63 (2006.01) G01N 21/21 (2006.01) G01N 21/47 (2006.01) G01N 33/53 (2006.01) G01N 33/566 (2006.01)
Patent
CA 2655079
The present invention relates to detecting and/or measuring scattering effects due to the aggregating metallic nanostructures or the interaction of plasmonic emissions from approaching metallic nanoparticles. The scattering effects may be measured at different angles, different wavelengths, changes in absorption and/or changes in polarization relative to changes in the distances between nanoparticles.
Le procédé selon l'invention consiste à détecter et/ou à mesurer des effets de diffusion provoqués par l'agrégation de nanostructures métalliques ou l'interaction d'émissions plasmoniques générées par l'approche de nanoparticules métalliques. Les effets de diffusion peuvent être mesurés à différents angles, différentes longueurs d'ondes, au niveau de changements dans l'absorption et/ou la polarisation par rapport à des changements de distances séparant les nanoparticules.
Kirby Eades Gale Baker
University Of Maryland - Biotechnology Institute
LandOfFree
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