Blemish compensating system for a solid state image pick-up...

H - Electricity – 04 – N

Patent

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350/42, 350/48

H04N 3/15 (2006.01) H04N 5/217 (2006.01) H04N 9/04 (2006.01)

Patent

CA 1119716

Abstract of the Disclosure There is provided a blemish compensating system used for a solid state image pick-up device having a plurality of image pick-up elements which are arranged to store electric charges corresponding to an optical image formed on the light sensitive portions thereof and are sequentially energized by a driving circuit to derive out the electric charges stored on the respective image pick up elements. The blemish compensating system includes a memory which stores address data representing the position of a blemish image pick-up element and produces an output signal when the address of the memory storing the address data for the blemish image pick-up element is specificed by a signal in synchronism with the output of the driver circuit, a delay circuit for delaying the output signal of the solid state image pick-up device by a time required for one horizontal scanning, and a switch circuit in which, when it is at a first switching position, it permits the output signal of the solid state image pick-up device to pass there- through, and in which, in response to the output signal from the memory circuit, it is set to a second switching position so that it permits the output signal from the solid state image pick-up device by way of the delay circuit to pass therethrough.

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