Calibration frame

G - Physics – 01 – B

Patent

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Details

G01B 11/00 (2006.01) G01B 21/04 (2006.01)

Patent

CA 2199409

A calibration frame for a non-contact measurement system includes a frame structure (12); a plurality of targets (14) which may be light emitting diodes supported by the frame structure for viewing by the measurement system; control means for activating each of the targets for allowing the targets to be identified by the measurement system; memory means for storing data relating to the position of each target; and a communication link such as an infrared link for transferring data from the calibration frame to the measurement system which relates to the position of that target.

Un cadre d'étalonnage, destiné à un système de mesure sans contact, comporte une structure en cadre (12), plusieurs cibles (14) pouvant être des diodes électro-luminescentes, supportées par cette structure en cadre et que le système de mesure peut viser, un dispositif de commande qui active chacune de ces cibles pour permettre au système de mesure de les identifier, une mémoire qui enregistre des données concernant la position de chaque cible, et une liaison de communications, par infrarouge par exemple, qui envoie depuis le cadre d'étallonnage, vers ce système de mesure, les données concernant la position de cette cible.

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