G - Physics – 01 – R
Patent
G - Physics
01
R
324/3
G01R 35/00 (2006.01)
Patent
CA 1284673
CALIBRATION METHOD FOR APPARATUS EVALUATING MICROWAVE/MILLIMETER WAVE CIRCUITS Abstract A calibration procedure for vector network analyzers utilizing a known standard, an unknown standard and a pair of offsets bearing a known length ratio (2:1) between them whereby measurements taken on the standards and their combinations with the offsets result in self-verifying redundant equations which furnish: (1) error terms according to well-known flow graph models, (2) the reflection of the unknown standard, (3) the transmission factor of the waveguiding medium from which the offsets are realized regardless of the waveguide's loss or dispersion, and (4) a figure of merit (corruption coefficient) for the quality of the acquired raw data without the necessity for computing the error terms, connecting verification standards or otherwise completing the calibration process.
579303
Jakhete Rajendra S.
Sequeira Hermann B.
Trippe Michael W.
Jakhete Rajendra S.
Macrae & Co.
Martin Marietta Corporation
Sequeira Hermann B.
Trippe Michael W.
LandOfFree
Calibration method for apparatus evaluating... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Calibration method for apparatus evaluating..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Calibration method for apparatus evaluating... will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1270414