G - Physics – 01 – B
Patent
G - Physics
01
B
G01B 11/25 (2006.01) G01B 21/04 (2006.01) G06T 7/00 (2006.01)
Patent
CA 2730033
A method for calibrating a measuring system, which system comprises a structured light source, optics and a sensor. The light source is adapted to produce a light plane or sheet and the optics is located between the light plane and the sensor. The method is performed in order to obtain a mapping from the sensor to the light plane. In the method the light source is switched on such that the light plane is produced. In order to account for distortions due to the optics, a mapping calibration profile is introduced in the light plane, wherein the mapping calibration profile comprises at least three points forming a straight line. A non-linear mapping from the sensor to the light plane is then computed by using the at least three points. Next, in order to account for perspective distortions, a homography calibration profile is introduced in the light plane, wherein the homography calibration profile comprises at least four points the relative distance between which are predetermined. A homography from the sensor to at the light plane based on these four points is then computed. A calibration object for using in such a method is also presented.
La présente invention concerne un procédé détalonnage dun système de mesure, ledit système comprenant une source lumineuse, un dispositif optique et un capteur. La source lumineuse est conçue pour produire un plan lumineux et le dispositif optique est positionné entre le plan lumineux et le capteur. Le procédé est mis en uvre afin dobtenir une correspondance avec au moins un point sur le capteur et au moins un point dans le plan lumineux. Le procédé comprend les étapes consistant à : allumer la source lumineuse de façon à produire le plan lumineux et introduire un profil détalonnage de correspondance dans une première position de correspondance dans le plan lumineux, dans lequel le profil détalonnage de correspondance comprend au moins trois points formant une ligne droite. La présente invention concerne également un objet détalonnage qui peut être utilisé dans de tels procédés détalonnage.
Andersson Robert
Turbell Henrik
Mccarthy Tetrault Llp
Sick Ivp Ab
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