Cantilever unit and atomic force microscope, magnetic force...

G - Physics – 01 – B

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G01B 5/20 (2006.01) G01B 7/28 (2006.01) G01B 9/02 (2006.01) G01P 15/08 (2006.01) G01R 33/038 (2006.01) G11B 9/00 (2006.01) G11B 21/00 (2006.01)

Patent

CA 2065593

A cantilever unit comprises a cantilever for supporting a probe and a displacement amount detecting means, the displacement amount detecting means being integrated with the cantilever. An information processing apparatus comprises the cantilever unit and optionally an information recording medium stationed in close vicinity to the unit, wherein an information in the medium is reproduced at a signal on the basis of an displacement amount of the cantilever. An atomic force microscope and magnetic force microscope comprise the cantilever unit, respectively.

Cette invention concerne une unité à poutre en porte-à-faux portant une sonde et un moyen de détection du déplacement, celui-ci étant intégré à la poutre en porte-à-faux. Un dispositif de traitement de l'information est équipé de l'unité à poutre en porte-à-faux et, facultativement, d'un support d'enregistrement de données placé à très faible distance la poutre en porte-à-faux et dont le contenu est reproduit sous forme de signaux proportionnels au déplacement de la poutre en porte-à-faux. L'objet de l'invention trouve des applications dans les microscopes à force atomique et les microscopes à force magnétique.

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