Capacitance-type material level indicator and...

G - Physics – 01 – F

Patent

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26/112, 340/141,

G01F 23/26 (2006.01)

Patent

CA 1191717

Abstract of the Disclosure A capacitance probe and method of probe manufacture for material level sensing systems and like applications. The probe includes a probe rod, a tubular guard coaxially surrounding the rod intermediate the rod ends, and in- sulation material formed as an integral piece in an in- jection molding operation surrounding the rod between the rod and guard and also surrounding and radially overlapping axially spaced ends of the tubular guard. One end of the rod and a portion of the guard intermediate its ends are exposed through the insulation material. The molded assembly is captured within a nipple or the like for mounting to a material vessel such that the exposed surfaces of the rod and guard are disposed internally of the vessel for capacitance coupling to material therewithin.

432826

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