G - Physics – 01 – F
Patent
G - Physics
01
F
26/112, 340/141,
G01F 23/26 (2006.01)
Patent
CA 1191717
Abstract of the Disclosure A capacitance probe and method of probe manufacture for material level sensing systems and like applications. The probe includes a probe rod, a tubular guard coaxially surrounding the rod intermediate the rod ends, and in- sulation material formed as an integral piece in an in- jection molding operation surrounding the rod between the rod and guard and also surrounding and radially overlapping axially spaced ends of the tubular guard. One end of the rod and a portion of the guard intermediate its ends are exposed through the insulation material. The molded assembly is captured within a nipple or the like for mounting to a material vessel such that the exposed surfaces of the rod and guard are disposed internally of the vessel for capacitance coupling to material therewithin.
432826
Brenton Ronald G.
Fleckenstein Phillip P.
Runck Robin B.
Berwind Corporation
Marks & Clerk
Venture Measurement Company Llc
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