Capacitive thickness gauging

Details Capacitive thickness gauging Capacitive thickness gauging

G - Physics

01

B

340/135.2

G01B 7/04 (2006.01) G01R 27/26 (2006.01) G01B 7/08 (1980.01)

Patent

CA 1052886

A B S T R A C T A system for capacitively gauging distance to an element which is not in a low impedance path to ground. The gauging system operates to provide an indication of distance with the potential on the element at a defined, level, typically ground. Several embodiments are presented for making this measurement. A first operates to measure distance at periodic instances when the defined potential exists. A second embodiment uses phase opposite excitation to produce a defined potential at the element either by specific placement of the element or through a feedback control over element potential. The system of the present invention may be adapted for use in capacitive thickness measurement on an ungrounded or highly resistive element.

234548

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