Centralized control architecture for a laser materials...

B - Operations – Transporting – 23 – K

Patent

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B23K 26/03 (2006.01)

Patent

CA 2519799

Apparatus, systems, and methods for monitoring the processing of a workpiece that includes directing an incident laser beam onto the workpiece and using an optical detector (13,20) for measuring a signal emitted from the workpiece (11,12) as a result of the incident laser beam. The detector generates at least two signals based upon the optical signal. The method also involves use of a light source monitor in determining workpiece processing quality based upon the quotient of the two outputs as well as a magnitude of one of the two quotients.

L'invention concerne un appareil, des systèmes et des méthodes pour surveiller le traitement d'une pièce. Ces méthodes consistent à diriger un faisceau laser incident sur la pièce et à utiliser un détecteur optique pour mesurer un signal émis à partir de la pièce, résultant du faisceau laser incident. Le détecteur génère au moins deux signaux en fonction du signal optique. La méthode consiste également à utiliser un dispositif de surveillance de source lumineuse pour déterminer la qualité de traitement de la pièce, en fonction du quotient de deux sorties, ainsi que de la magnitude d'un ou de deux quotients.

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