Channel bank loop-around test arrangement and method

H - Electricity – 04 – B

Patent

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Details

324/58.02

H04B 17/00 (2006.01) H04J 3/14 (2006.01)

Patent

CA 1147391

Abstract of the Disclosure The present invention relates to a method of testing a PCM channel bank arrangement having a time division multiplex line serving a plurality of PCM channels. A plurality of analog lines and a plurality of channel units are provided each coupling one of the PCM channels to the multiplex line with one of the analog lines and each having a receive path wherealong PCM signals are converted to analog signals and a transmit path wherealong analog signals are converted to PCM signals and a loop-around path coupling the receive and the transmit paths. A testing controller is provided coupled to the transmit path and the receive path of each of the channel units. The method is characterized by the steps of circulating from the testing controller via the loop-around path and back to the testing controller a sequence of prescribed PCM test code words. Each word defines an amplitude magnitude of a waveform having piecewise linearly positive and negative sloping portions. The method includes the step of evaluating the circulated test code words for undesirable levels of signal degradation.

349969

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