Chemically differentiated imaging by scanning atomic force...

Details Chemically differentiated imaging by scanning atomic force... Chemically differentiated imaging by scanning atomic force...

G - Physics

01

Q

G01Q 60/24 (2010.01) G01Q 60/34 (2010.01) C40B 30/04 (2006.01) G11B 9/14 (2006.01)

Patent

CA 2169522

The invention relates to a process for chemically differentiated imaging by means of scanning atomic force microscopy using chemi- cally modified probes, where the imaging is carried out in normal force mode, elasticity mode, tapping mode or non-contact mode. The novel process is suitable for imaging industrial surfaces.

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