Chips having elevated sample surfaces

Details Chips having elevated sample surfaces Chips having elevated sample surfaces

C - Chemistry, Metallurgy

12

M

C12M 1/18 (2006.01) B01J 19/00 (2006.01) B01L 3/00 (2006.01) B01L 3/02 (2006.01) B81B 1/00 (2006.01)

Patent

CA 2400159

A test device is disclosed having a base (22) that is a non-sample surface and sample structures (25 (a,b)) comprising pillars (20 (a,b)).

La présente invention concerne un dispositif pour essais qui possède une base (22) qui est une surface non destinée aux échantillons et des structures d'échantillonnage (25(a, b)) comprenant des colonnes (20(a, b)).

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