Circuit for measuring the resistance of test-pieces

Details Circuit for measuring the resistance of test-pieces Circuit for measuring the resistance of test-pieces

G - Physics

01

R

324/45

G01R 27/02 (2006.01) G01R 27/08 (2006.01)

Patent

CA 2010240

The invention relates to a circuit for measuring the resistance of test-pieces, comprising a test circuit containing a first electronic semiconductor switch (15) and also comprising a test-piece (7) and a current-measuring device (11) for measuring the test current (Ip) flowing through the test-piece (7), and a measuring circuit comprising a second electronic semiconductor switch (16) which is connected in parallel to the first electronic semiconductor switch (15) and contains a device (12) for measuring a voltage drop in the test circuit. The first semiconductor switch is an IGBT type transistor (15) and the second semiconductor switch is a field-effect transistor.

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