Circumferentially compensating eddy current probe

Details Circumferentially compensating eddy current probe Circumferentially compensating eddy current probe

G - Physics

01

N

324/50

G01N 27/90 (2006.01)

Patent

CA 1274277

TITLE CIRCUMFERENTIALLY COMPENSATING EDDY CURRENT PROBE INVENTORS V. S. Cecco R. McIlquham F. L. Sharp ABSTRACT An eddy current probe capable of detecting localized defects with 100% circumferential coverage in tubes, tubes under support plates etc., is disclosed. The probe employs multiple receiver coils with each excitation coil, operating in transmit-receive mode in which alternate receiver coils are electromagnetically oriented in opposite directions. The probe detects localized defects and eliminates concentric vari- ations.

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