Clearance measurement system and method of operation

Details Clearance measurement system and method of operation Clearance measurement system and method of operation

G - Physics

01

B

G01B 21/16 (2006.01) F01D 21/04 (2006.01) G01B 7/14 (2006.01) G01R 31/34 (2006.01)

Patent

CA 2555480

A clearance measurement system (12) is provided. The clearance measurement system (12) includes a reference geometry (86) disposed on a first object (14) having an otherwise continuous surface geometry and a sensor (64) disposed on a second object (16), wherein the sensor (64) is configured to generate a first signal representative of a first sensed parameter from the first object (14) and a second signal representative of a second sensed parameter from the reference geometry (86). The clearance measurement system (12) also includes a processing unit (198) configured to process the first and second signals to estimate a clearance between the first and second objects (14, 16) based upon a measurement difference between the first and second sensed parameters.

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