G - Physics
05
D
341/31, 73/56
G05D 25/02 (2006.01) G01J 3/46 (2006.01) G01N 21/86 (2006.01)
Patent
CA 2038103
The stack reflectance is predicted from an on-line, wavelength dependent measurement of the sheet reflectance and the on-line measurement of the sheet opacity at a wavelength interval. The stack reflectance Rst is then used to predict and/or control stack color, preferably by using the parameter K/S = (1-Rst)/2 Rst.
Abb Process Automation Inc.
Smart & Biggar
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