Color measurement

G - Physics – 05 – D

Patent

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Details

341/31, 73/56

G05D 25/02 (2006.01) G01J 3/46 (2006.01) G01N 21/86 (2006.01)

Patent

CA 2038103

The stack reflectance is predicted from an on-line, wavelength dependent measurement of the sheet reflectance and the on-line measurement of the sheet opacity at a wavelength interval. The stack reflectance Rst is then used to predict and/or control stack color, preferably by using the parameter K/S = (1-Rst)/2 Rst.

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