Combined thermal analyzer and x-ray diffractometer

Details Combined thermal analyzer and x-ray diffractometer Combined thermal analyzer and x-ray diffractometer

G - Physics

01

N

358/11.4

G01N 23/207 (2006.01) G01N 25/20 (2006.01) G01N 25/48 (2006.01)

Patent

CA 1228682

Abstract of the Invention Scientific apparatus and a method are described for observing simultaneously both structural and thermo- dynamic properties of materials. An X-ray diffractometer and a thermal analyzer are mounted to cooperate and coact on the same sample and to complete a meaningful analysis in a very few minutes. The diffractometer is equipped with a rapid position-sensitive detector connected to a multichannel analyzer to record and display X-ray diffraction data from the sample over an angle of 20° (two theta) or more. The thermal analyzer is preferably a differential scanning calorimeter. By correlating X-ray diffraction and thermal data taken simultaneously while the sample is passing through a range of temperatures and/or environments, structural changes corresponding to thermal events can be identified and elucidated.

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