Comparative type measuring calibrating and interpolating system

Details Comparative type measuring calibrating and interpolating system Comparative type measuring calibrating and interpolating system

G - Physics

01

C

33/1, 33/82

G01C 25/00 (2006.01)

Patent

CA 1138189

ABSTRACT OF THE DISCLOSURE The invention relates to a method of calibrating a width measurement device employing radiation sensor means scanning an object whose width is to be measured comprising placing a reference grid in a reference plane which is scanned by said sensor means, and determining the values of output signals from said measurement device for known co-ordinates on said grid.

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