Composite analyzer tester

G - Physics – 01 – N

Patent

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Details

349/35, 324/43,

G01N 29/00 (2006.01) G01N 27/02 (2006.01) G01N 27/82 (2006.01)

Patent

CA 1269709

ABSTRACT OF THE DISCLOSURE A single composite analyzer tester instrument capable of nondestructively analyzing and testing several different properties of graphite-resin materials, such as the thickness, sonic velocity, relative sonic amplitude and relative electrical conductivity thereof. The instrument incorporates therein a magnetic induction circuit for measuring the thickness of the test material, which includes a magnetic induction probe with a magnetic induction coil which is placed adjacent to the outer surface of the material. The instrument also includes an ultrasonic pulse-echo circuit for performing two separate but related tests, a measurement of the ultrasonic velocity of the test material, and also a measurement of the relative change in amplitude of an ultrasonic pulse as it traverses the test material from an outer surface thereof to an inner surface, where it is echoed back to the outer surface for detection. This circuit includes an acoustic probe which is placed adjacent to the outer surface of the test material, at the same location where the first probe was placed. Finally, the instrument incorporates therein an eddy current circuit for measuring the relative electrical conductivity of the test material. This circuit includes an eddy current probe with an eddy current coil which is placed adjacent to the outer surface of the test material at the same location as the two previous probes. The magnetic induction circuit, the ultrasonic pulse-echo circuit, and the eddy current circuit are all implemented in a single microprocessor-based unit utilizing extensive digital signal processing. Moreover, the magnetic induction probe, the acoustic probe, and the eddy current probe are each attached to, and detachable from, the console of the unit by electrical plug connections.

544204

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