G - Physics – 02 – B
Patent
G - Physics
02
B
88/16, 88/96.2
G02B 21/06 (2006.01) G02B 21/00 (2006.01)
Patent
CA 1297714
CONFOCAL TANDEM SCANNING REFLECTED LIGHT MICROSCOPE ABSTRACT A Tandem Scanning Microscope is disclosed using a modified Nipkow disk design. With this scanning system, scanning is performed using many apertures at once and using one disk for both image and illumination scanning. The apertures in the disk are in an annular pattern of spiral arms. Each aperture is located along a spiral arm at the end of a radius vector. Relative aperture locations are established in accordance with a mathematical relationship. C4/TRAP009
584946
Buchholz Jeffrey C.
Fairing John D.
Mccarthy Jon J.
Finlayson & Singlehurst
Noran Instruments Inc.
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