Conical baffle for reducing charging drift in a particle...

H - Electricity – 01 – J

Patent

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H01J 37/09 (2006.01)

Patent

CA 2240531

A conical shaped baffle aperture reduces beam position drift due to electrostatic charging of insulating contamination layers on beam tube walls of a charged particle beam system. The geometric cone angle, aperture size and apex location of the baffle with respect to the source of contamination and secondary radiation are selected so that the inner walls of the baffle and the beam itself are invisible from the source, and therefore remain free of the insulating contamination layers that would otherwise cause charging drift.

Cette ouverture de chicane de forme conique permet de réduire la dérive de position d'un faisceau, résultant de la charge électrostatique des couches contaminées et isolantes qui se sont déposées sur les parois du tube à faisceau d'un système à faisceau de particules chargées. On a choisi l'angle géométrique du cône, la dimension de l'ouverture et l'emplacement du sommet de la chicane par rapport à la source de contamination et de rayonnement secondaire, de façon que les parois intérieures de la chicane et le faisceau lui-même soient invisibles depuis la source, et donc restent à distance des couches de contamination isolantes, lesquelles provoqueraient sinon une dérive de charge.

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