Constant modulation index technique for measuring the...

Details Constant modulation index technique for measuring the... Constant modulation index technique for measuring the...

G - Physics

01

N

354/153, 328/174

G01N 21/01 (2006.01) G01R 19/00 (2006.01) G01R 21/14 (2006.01) H01S 5/00 (2006.01) H01S 5/068 (2006.01)

Patent

CA 1073552

Abstract of the Disclosure Described is a technique for generating directly certain derivatives of device parameters by measuring the device response to ac modulation under conditions of constant modulation index. In particular, the technique as it applies to measuring directly idF/di and i2d2P/di2 for A1CaAs DN p-a junction lasers is described for two cases: where the generalized function F equals either voltage V across the laser or the light intensity output L of the laser, and i equals current through the laser. For p-n junction lasers this technique permits measurement of the series resistance R?, lasing current threshold ith and the exponential factor?=q/mkT.

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