Contact for use in testing integrated circuits

Details Contact for use in testing integrated circuits Contact for use in testing integrated circuits

G - Physics

01

R

G01R 1/06 (2006.01)

Patent

CA 2588313

A contact for use in a contact set assembly. The contact spans a space which separates a lead of an integrated circuit to be tested and a pad of a load board interfacing with the tester. The contact construction provides electrical communication between integrated circuit lead and the load board pad. Included is an insulating lamina which comprises, in part, a contact. A conductive lamina overlies at least a portion of the insulating lamina. The laminar construction and size and shape of conductive traces applied to a ceramic lamina enable parameters of the contact to be provided.

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